12 Patents
- US123621392025Semiconductor Inspection Apparatus and Semiconductor Inspection Method Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123528082025Substrate Inspection Apparatus and Substrate Inspection Method
Samsung Electronics Co., Ltd.
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- US119782232024Electronic Device Including Processing Circuit for Generating Depth Information Using Luminance Data and Method of Generating Depth Information
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US117545172023Inspection Apparatus for Inspecting Semiconductor Devices Using Charged Particles
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117227952023Image Processing Device for Noise Reduction Using Dual Conversion Gain and Operation Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116834662023Application Processor, Electronic Device Including the Same and Operation Method of the Electronic Device
Samsung Electronics Co., Ltd.
0 cites - US116117082023Apparatus for Stabilizing Digital Image, Operating Method Thereof, and Electronic Device Having the Same
Samsung Electronics Co., Ltd.
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