Sushant Sonde

5 Patents

• US125409052026

  System and Method for Optical Mapping of Semiconductor Wafers at Cryogenic Temperatures Under Transmission Geometry

  EPIR, Inc.

  0 cites
• US123176332025

  Radiation Hardened Infrared Focal Plane Array

  EPIR, Inc.

  0 cites
• US120757012024

  Hgcdte Metasurface-based Terahertz Source and Detector

  EPIR, Inc.

  0 cites
• US117253002023

  In-situ Laser Annealing of Te Growth Defects in Cdznte (ilast-czt)

  EPIR, Inc.

  0 cites
• US116706162023

  Modified Direct Bond Interconnect for Fpas

  EPIR, Inc.

  0 cites