Surendra Singh Srivastava

5 Patents

• US124493092025

  Methods for Detection Using Optical Emission Spectroscopy

  Applied Materials, Inc.

  0 cites
• US121966172025

  Temperature Profile Measurement and Synchronized Control on Substrate and Susceptor in an Epitaxy Chamber

  Applied Materials, Inc.

  0 cites
• US121659342024

  Substrate Processing Monitoring

  Applied Materials, Inc.

  0 cites
• US118609732024

  Method and System for Foreline Deposition Diagnostics and Control

  Applied Materials, Inc.

  0 cites
• US116353382023

  Rapid Chamber Vacuum Leak Check Hardware and Maintenance Routine

  Applied Materials, Inc.

  0 cites