Patents/Inventors

Sunhong Jun

Suwon-siKR5 patents

5 Patents

US125661282026
Measurement Apparatus and Measurement Method Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124742602025
Terahertz Signal Measuring Apparatus and Measuring Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124697502025
Method of Extracting Properties of a Layer on a Wafer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US123321642025
Dual Resolution Spectrometer, and Spectrometric Measurement Apparatus and Method Using the Spectrometer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119212702024
Inspection System Including Reference Specimen and Method of Forming Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites