18 Patents
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- US124312092025Memory Devices, Operating Methods of the Memory Devices, and Test Systems Including the Memory Devices
Samsung Electronics Co., Ltd.
0 cites - US123878112025Semiconductor Memory Device Including an On-die ECC Engine
Samsung Electronics Co., Ltd.
0 cites - US123798552025Semiconductor Memory Device Including a Cyclic Redundancy Check Engine and Memory System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US122357572025Memory Systems and Controllers for Generating a Command Address and Methods of Operating Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122123392025Error Correction Circuit, Memory System, and Error Correction Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US121705332024Semiconductor Memory Device and Method of Operating Semiconductor Memory Device
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- US120571842024Memory Systems Having Memory Devices Therein with Enhanced Error Correction Capability and Methods of Operating Same
Samsung Electronics Co., Ltd.
0 cites - US119478102024Semiconductor Memory Device and Memory System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US119429682024Transmitter and Receiver for 3-level Pulse Amplitude Modulation Signaling and System Including the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites
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- US118417632023Semiconductor Memory Devices with ECC Engine Defect Determination Based on Test Syndrome, Test Parity, Expected Decoding Status and Received Decoding Status
Samsung Electronics Co., Ltd.
0 cites - US118296142023Semiconductor Memory Devices and Methods of Operating Semiconductor Memory Devices
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US117266702023Methods of Operating Memory Controllers, Memory Controllers Performing the Methods and Memory Systems Including the Memory Controllers
Samsung Electronics Co., Ltd.
0 cites - US116054412023Memory Systems Having Memory Devices Therein with Enhanced Error Correction Capability and Methods of Operating Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites