15 Patents
- US126223212026Semiconductor Device Including Through-silicon via (TSV) Test Device and Operating Method Thereof
Industry-academic Cooperation Foundation, Yonsei University
0 cites - US126079792026Scan Cell Placing Method and Scan Cell Placing Apparatus
UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
0 cites - US125688602026Semiconductor Device Including Through-silicon via (TSV) Test Device and Operating Method Thereof
Industry-academic Cooperation Foundation, Yonsei University
0 cites - US124053032025Scan Chain Security Circuit and Driving Method Thereof
UIF (University Industry Foundation), Yonsei University
0 cites - 0 cites
- US122835292025Method of Repairing Through-electrodes, Repair Device Performing the Same and Semiconductor Device Including the Same
Samsung Electronics Co., Ltd.
0 cites - US121753612024Electronic Device, Image Processing Method of Electronic Device, and Computer-readable Medium
Samsung Electronics Co., Ltd.
0 cites - US121691452024Zero Power Micromechanical Switch-based Sensing and Monitoring System
Northeastern University
0 cites - US120019542024Method of Performing Learning of Deep Neural Network and Apparatus Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120008912024Scan Correlation-aware Scan Cluster Reordering Method and Apparatus for Low-power Testing
UIF (University Industry Foundation), Yonsei University
0 cites - US119668462024Method of Performing Learning of Deep Neural Network and Apparatus Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US118099542023Method of Performing Learning of Deep Neural Network and Apparatus Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117559042023Method and Device for Controlling Data Input and Output of Fully Connected Network
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US115671322023Scan Apparatus Capable of Fault Diagnosis and Scan Chain Fault Diagnosis Method
UIF (University Industry Foundation), Yonsei University
0 cites - 0 cites