Patents/Inventors

Sungho Jang

Suwon-siKR16 patents

12 Patents

US125605322026
Apparatus for Measuring Radical Density Distribution Based on Light Absorption and Operating Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US125575872026
Apparatus and Method Monitoring Semiconductor Manufacturing Equipment
Samsung Electronics Co., Ltd.
0 cites
US125387332026
Stealth Dicing Laser Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124943522025
Plasma Confinement Ring, Semiconductor Manufacturing Apparatus Including the Same, and Method of Manufacturing a Semiconductor Device Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124552282025
Semiconductor Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites
US124313412025
Apparatus for Arcing Diagnosis, Plasma Process Equipment Including the Same, and Arcing Diagnosis Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124222452025
Semiconductor Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites
US123470962025
Semiconductor Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites
US123133932025
Level Sensor and Substrate Processing Apparatus Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US118989122024
Hyperspectral Imaging (HSI) Apparatus and Inspection Apparatus Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US117354372023
Apparatus and Method for Treating Substrate
SEMES CO., Ltd.
0 cites
US116762632023
Extreme Ultraviolet (EUV) Collector Inspection Apparatus and Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites