3 Patents
- US124742662025Method and System for Moiré Profilimetry Using Simultaneous Dual Fringe Projection
CENTRO DE INVESTIGACIONES EN OPTICA A.C.
0 cites - US118807682024Method and Apparatus with Bit-serial Data Processing of a Neural Network
Seoul National University R&DB Foundation
0 cites - US116309972023Method and Apparatus with Bit-serial Data Processing of a Neural Network
Seoul National University R&DB Foundation
0 cites