Sun Jung Kim

5 Patents

• US124823502025

  Method and System for Calculating and Comparing Evaluation Indices for Signal System of Intersection

  0 cites
• US122997782025

  Method and Apparatus for Generating X-ray Image and Computer-readable Recording Medium

  OSSTEMIMPLANT CO., Ltd.

  0 cites
• US122060262025

  Semiconductor Device Including Multi-thickness Nanowires

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US118211062023

  Semiconductor Process Chamber Including Lower Volume Upper Dome

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US116827352023

  Semiconductor Device Including Nanowires Having Multi-thickness Regions

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites