10 Patents
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- US122833312025Test Circuit for Detecting Word Line Defect and Semiconductor Apparatus Including the Same
SK Hynix Inc.
0 cites - US122654082025Apparatus for Controlling In-rush Current and an Operation Method Thereof
SK Hynix Inc.
0 cites - US121648062024Semiconductor Memory Device and Method of Operating the Semiconductor Memory Device
SK Hynix Inc.
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- US118154092023Temperature Sensor, Memory Device and Method for Controlling the Temperature Sensor
SK Hynix Inc.
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