Suhwan Park

7 Patents

• US124743932025

  Terahertz Probe

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US124697502025

  Method of Extracting Properties of a Layer on a Wafer

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US121966692025

  Inspection Apparatus and Method of Inspecting Wafer

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US121659332024

  Semiconductor Substrate Processing Apparatus and Semiconductor Substrate Measuring Apparatus Using the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US119468812024

  Inspection Apparatus and Inspection Method Using Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US116886232023

  Wafer Inspection Apparatuses

  Samsung Electronics Co., Ltd.

  0 cites
• US115791672023

  Probe for Detecting Near Field and Near-field Detection System Including the Same

  Samsung Electronics Co., Ltd.

  0 cites