Patents/Inventors

Sudharshanan Raghunathan

Fremont, CAUS1 patent

2 Patents

US126134722026
Process Window Based on a Failure Rate Model
ASML NETHERLANDS B.V.
0 cites
US123862682025
Method for Calibrating Simulation Process Based on Defect-based Process Window
ASML NETHERLANDS B.V.
0 cites