Su Hyun Oh

4 Patents

• US125734632026

  Memory Device Detecting Fail of Through-silicon Via

  SK Hynix Inc.

  0 cites
• US122609292025

  Semiconductor Device Including Internal Transmission Path and Stacked Semiconductor Device Using the Same

  SK Hynix Inc.

  0 cites
• US119421812024

  Semiconductor Device Including Internal Transmission Path and Stacked Semiconductor Device Using the Same

  SK Hynix Inc.

  0 cites
• US118941022024

  Duty Correction Device Including Duty Correction Circuit and Semiconductor Device Including Duty Correction Device

  SK Hynix Inc.

  0 cites