Steven W. Meeks

7 Patents

• US121467322024

  Surface Contour Measurement

  Lumina Instruments Inc.

  0 cites
• US121468302024

  Slope, P-component and S-component Measurement

  Lumina Instruments Inc.

  0 cites
• US121470332024

  Scanning Micro Profiler

  Lumina Instruments Inc.

  0 cites
• US121302432024

  Angle Independent Optical Surface Inspector

  Lumina Instruments Inc.

  0 cites
• US119886152024

  Region Prober Optical Inspector

  Lumina Instruments Inc.

  0 cites
• US118525922023

  Time Domain Multiplexed Defect Scanner

  0 cites
• US117331732023

  Time Domain Multiplexed Defect Scanner

  Lumina Instruments Inc.

  0 cites