Patents/Inventors

Steven Michael Kientz

Westminster, COUS66 patents

47 Patents

US126204472026
Adaptive Temperature Compensation for a Memory Device
Micron Technology, Inc.
0 cites
US126145962026
Enhanced Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US126031332026
Slow Charge Loss Monitor for Power Up Performance Boosting
Micron Technology, Inc.
0 cites
US125800372026
Adaptable Charge Loss Scanning Cadence in a Memory Sub-system
Micron Technology, Inc.
0 cites
US125788622026
Die Family Management on a Memory Device Using Block Family Error Avoidance
Micron Technology, Inc.
0 cites
US125486282026
Slow-charge-loss Tracking Using Feedback-control Loop
Micron Technology, Inc.
0 cites
US124825302025
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US124512082025
Charge Loss Tracking Through Targeted Bit Count
Micron Technology, Inc.
0 cites
US124302062025
Temperature Sensor Management During Error Handling Operations in a Memory Sub-system
Micron Technology, Inc.
0 cites
US124312052025
Adaptive Calibration for Threshold Voltage Offset Bins
Micron Technology, Inc.
0 cites
US124230132025
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US124242872025
Memory Read Voltage Threshold Tracking Based on Memory Device-originated Metrics Characterizing Voltage Distributions
Micron Technology, Inc.
0 cites
US123537712025
Charge Loss Mitigation Throughout Memory Device Lifecycle by Proactive Window Shift
Micron Technolgy, Inc.
0 cites
US123224732025
Determining Read Voltage Offset in Memory Devices
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US122930992025
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US122664202025
Temperature-compensated Time Estimate for a Block to Reach a Uniform Charge Loss State
Micron Technology, Inc.
0 cites
US122231902025
Measurement of Representative Charge Loss in a Block to Determine Charge Loss State
Micron Technology, Inc.
0 cites
US122107592025
Threshold Voltage Bin Calibration at Memory Device Power Up
Micron Technology, Inc.
0 cites
US121317952024
Adaptive Temperature Compensation for a Memory Device
Micron Technology, Inc.
0 cites
US121190682024
Program Continuation Strategies After Memory Device Power Loss
Micron Technology, Inc.
0 cites
US120738662024
Two-stage Voltage Calibration Upon Power-up of Memory Device
Micron Technology, Inc.
0 cites
US120571902024
Determining Read Voltage Offset in Memory Devices
Micron Technology, Inc.
0 cites
US120400252024
Two-sided Page Scans with Calibration Feedback
Micron Technology, Inc.
0 cites
US119777742024
Charge Loss Mitigation Throughout Memory Device Lifecycle by Proactive Window Shift
Micron Technology, Inc.
0 cites
US119551942024
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US119220412024
Threshold Voltage Bin Calibration at Memory Device Power Up
Micron Technology, Inc.
0 cites
US119148902024
Trim Value Loading Management in a Memory Sub-system
Micron Technology, Inc.
0 cites
US118867122024
Die Family Management on a Memory Device Using Block Family Error Avoidance
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118622742024
Determination of State Metrics of Memory Sub-systems Following Power Events
Micron Technology, Inc.
0 cites
US118546492023
Temperature-compensated Time Estimate for a Block to Reach a Uniform Charge Loss State
Micron Technology, Inc.
0 cites
US118535562023
Combining Sets of Memory Blocks in a Memory Device
Micron Technology, Inc.
0 cites
US118420612023
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US117972052023
Measurement of Representative Charge Loss in a Block to Determine Charge Loss State
Micron Technology, Inc.
0 cites
US117352542023
Error Avoidance Based on Voltage Distribution Parameters of Blocks
Micron Technology, Inc.
0 cites
US117214092023
Smart Sampling for Block Family Scan
Micron Technology, Inc.
0 cites
US117097752023
Write Data for Bin Resynchronization After Power Loss
Micron Technology, Inc.
0 cites
US117042172023
Charge Loss Scan Operation Management in Memory Devices
Micron Technology, Inc.
0 cites
US117051932023
Error Avoidance Based on Voltage Distribution Parameters
Micron Technology, Inc.
0 cites
US116937452023
Error-handling Flows in Memory Devices Based on Bins
Micron Technology, Inc.
0 cites
US116755112023
Associating Multiple Cursors with Block Family of Memory Device
Micron Technology, Inc.
0 cites
US116640802023
Bin Placement According to Program-erase Cycles
Micron Technology, Inc.
0 cites
US116369132023
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US116046012023
Trim Value Loading Management in a Memory Sub-system
Micron Technology, Inc.
0 cites
US116003542023
Determination of State Metrics of Memory Sub-systems Following Power Events
Micron Technology, Inc.
0 cites
US115737202023
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites