4 Patents
- US120855882024Vertical Probe Head with Improved Contact Properties Towards a Device Under Test
Technoprobe S.p.a.
0 cites - 0 cites
- US118677232024Vertical Probe Head Having an Improved Contact with a Device Under Test
Technoprobe S.p.a.
0 cites - US118219182023Buckling Beam Probe Arrays and Methods for Making Such Arrays Including Forming Probes with Lateral Positions Matching Guide Plate Hole Positions
MICROFABRICA Inc.
0 cites