2 Patents
- US123136822025Method, System and Device of Serializing and De-serializing the Delivery of Scan Test Data Through Chip I/O to Reduce the Scan Test Duration of an Integrated Circuit
MARVELL ASIA PTE, Ltd.
0 cites - US119276302024System and Method for Schedule-based I/O Multiplexing for Integrated Circuit (IC) Scan Test
Marvell Asia Pte Ltd
0 cites