Souk Kim

5 Patents

• US125936592026

  Spectroscopic Device, Spectroscopic Method Using the Same, and Method of Fabricating Semiconductor Memory Device Using the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US123859462025

  Method of Inspecting Tip of Atomic Force Microscope and Method of Manufacturing Semiconductor Device

  KOREA ADVANCED INSTITUTE OF SCIENCE AND Technology

  0 cites
• US123621382025

  Method of Operating Scanning Electron Microscope (SEM) and Method of Manufacturing Semiconductor Device Using the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US121109382024

  Vibration Isolation Table for Semiconductor Equipment and Vibration Isolation Table System Including the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US120926562024

  Test Apparatus and Test Method Thereof

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites