6 Patents
- US125971192026Operating Method of Electronic Device Including Processor Executing Semiconductor Layout Simulation Module Based on Machine Learning
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- US123615372025Electronic Device Including Processor Executing Defect Detection Module, Operating Method of Electronic Device, and Method for Fabricating Semiconductor Integrated Circuit
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123549202025Method of Forming Optical Proximity Correction Model and Method of Fabricating Semiconductor Device Using the Same
Samsung Electronics Co., Ltd.
0 cites - US122998692025Computing Device for Predicting a Profile Using Deep Learning and Operating Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122299442025Defect Detection Method of Deep Learning-based Semiconductor Device and Semiconductor Element Manufacturing Method Including the Defect Detection Method
Samsung Electronics Co., Ltd.
0 cites