Sjoerd Nicolaas Lambertus Donders

9 Patents

• US124168702025

  Measuring Method and Measuring Apparatus

  ASML Netherlands B.V.

  0 cites
• US123668082025

  Substrate Holder, Lithographic Apparatus, Device Manufacturing Method, and Method of Manufacturing a Substrate Holder

  ASML NETHERLANDS B.V.

  0 cites
• US123531392025

  Substrate Holder and Method of Manufacturing a Substrate Holder

  ASML NETHERLANDS B.V.

  0 cites
• US122875862025

  Stage System, Lithographic Apparatus, Method for Positioning and Device Manufacturing Method

  ASML NETHERLANDS B.V.

  0 cites
• US121177212024

  Lithographic Apparatus and Device Manufacturing Method

  ASML Netherlands B.V.

  0 cites
• US119602132024

  Substrate Holder, Lithographic Apparatus, Device Manufacturing Method, and Method of Manufacturing a Substrate Holder

  ASML NETHERLANDS B.V.

  0 cites
• US118605522024

  Stage System, Lithographic Apparatus, Method for Positioning and Device Manufacturing Method

  ASML NETHERLANDS B.V.

  0 cites
• US117549292023

  Substrate Holder and Method of Manufacturing a Substrate Holder

  ASML NETHERLANDS B.V.

  0 cites
• US116284982023

  Substrate Holder, Lithographic Apparatus, Device Manufacturing Method, and Method of Manufacturing a Substrate Holder

  ASML NETHERLANDS B.V.

  0 cites