112 Patents
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Micron Technology, Inc.
0 cites - US125370642026Read Soft Bits Through Boosted Modulation Following Reading Hard Bits
Micron Technology, Inc.
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Micron Technology, Inc.
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Micron Technology Inc.
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MICRON TECHNOLOGY, Inc.
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Micron Technology, Inc.
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Micron Technology, Inc.
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Micron Technology, Inc.
0 cites - US123482442025Detecting a Stall Condition in Bit Flipping Decoding Using Syndrome Weight Slope
MICRON TECHNOLOGY, Inc.
0 cites - US123327432025Efficient Memory Use to Support Soft Information in Bit Flipping Decoders
MICRON TECHNOLOGY, Inc.
0 cites - US123333042025Methods for Performing Processing-in-memory Operations, and Related Systems
Micron Technology, Inc.
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MICRON TECHNOLOGY, Inc.
0 cites - US123267822025Adjustment of Code Rate as Function of Memory Endurance State Metric
Micron Technology, Inc.
0 cites - US123216132025Bit Flipping Decoder with Optimized Maximum Iterations for Varied Bit Flipping Thresholds
MICRON TECHNOLOGY, Inc.
0 cites - US123012542025Early Stopping of Bit-flip Low Density Parity Check Decoding Based on Syndrome Weight
Micron Technology, Inc.
0 cites - US122779782025Selective and Dynamic Deployment of Error Correction Code Techniques in Integrated Circuit Memory Devices
Micron Technology, Inc.
0 cites - US122664202025Temperature-compensated Time Estimate for a Block to Reach a Uniform Charge Loss State
Micron Technology, Inc.
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- US122231902025Measurement of Representative Charge Loss in a Block to Determine Charge Loss State
Micron Technology, Inc.
0 cites - US122178032025Determine Optimized Read Voltage via Identification of Distribution Shape of Signal and Noise Characteristics
Micron Technology, Inc.
0 cites - US121977422025Managing Error Compensation Using Charge Coupling and Lateral Migration Sensitivity
Micron Technology, Inc.
0 cites - US121190622024Managing Compensation for Cell-to-cell Coupling and Lateral Migration in Memory Devices Based on a Sensitivity Metric
Micron Technology, Inc.
0 cites - US121059612024Copyback Clear Command for Performing a Scan and Read in a Memory Device
Micron Technology, Inc.
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Micron Technology, Inc.
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Micron Technology, Inc.
0 cites - US120738992024Track Charge Loss Based on Signal and Noise Characteristics of Memory Cells Collected in Calibration Operations
Micron Technology, Inc.
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- US120462982024Managing Compensation for Charge Coupling and Lateral Migration in Memory Devices
Micron Technology, Inc.
0 cites - US120463072024Managing Program Verify Voltage Offsets for Charge Coupling and Lateral Migration Compensation in Memory Devices
Micron Technology, Inc.
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Micron Technology, Inc.
0 cites - US120090342024Classification of Error Rate of Data Retrieved from Memory Cells
Micron Technology, Inc.
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Micron Technology, Inc.
0 cites - US119968602024Scaled Bit Flip Thresholds Across Columns for Irregular Low Density Parity Check Decoding
Micron Technology, Inc.
0 cites - US119949472024Multi-layer Code Rate Architecture for Special Event Protection with Reduced Performance Penalty
Micron Technology, Inc.
0 cites - US119841712024Selective and Dynamic Deployment of Error Correction Code Techniques in Integrated Circuit Memory Devices
Micron Technology, Inc.
0 cites - US119841722024Read Disturb Mitigation Based on Signal and Noise Characteristics of Memory Cells Collected for Read Calibration
Micron Technology, Inc.
0 cites - US119830672024Adjustment of Code Rate as Function of Memory Endurance State Metric
MICRON TECHNOLOGY, Inc.
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Micron Technology, Inc.
0 cites - US119348242024Methods for Performing Processing-in-memory Operations, and Related Memory Devices and Systems
Micron Technology, Inc.
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Micron Technology, Inc.
0 cites - US118758462024Optimization of Soft Bit Windows Based on Signal and Noise Characteristics of Memory Cells
Micron Technology, Inc.
0 cites - US118682022024Granular Error Reporting on Multi-pass Programming of Non-volatile Memory
Micron Technology, Inc.
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MICRON TECHNOLOGY, Inc.
0 cites - US118696052024Adjusting Pass-through Voltage Based on Threshold Voltage Shift
Micron Technology, Inc.
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- US118546492023Temperature-compensated Time Estimate for a Block to Reach a Uniform Charge Loss State
Micron Technology, Inc.
0 cites - US118417532023Operating Temperature Management of a Memory Sub-system0 cites
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- US118297292023Spatiotemporal Fused-multiply-add, and Related Systems, Methods and Devices
Micron Technology, Inc.
0 cites - US118292452023Multi-layer Code Rate Architecture for Copyback Between Partitions with Different Code Rates
Micron Technology, Inc.
0 cites - US118237482023Voltage Bin Calibration Based on a Temporary Voltage Shift Offset
Micron Technology, Inc.
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- US118088062023Allocation of Test Resources to Perform a Test of Memory Components
Micron Technology, Inc.
0 cites - US117973832023Redundant Array of Independent NAND for a Three-dimensional Memory Array
Micron Technology, Inc.
0 cites - US117972052023Measurement of Representative Charge Loss in a Block to Determine Charge Loss State
Micron Technology, Inc.
0 cites - US117753812023Redundancy Metadata Schemes for RAIN Protection of Large Codewords
Micron Technology, Inc.
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- US117752172023Adaptive And/or Iterative Operations in Executing a Read Command to Retrieve Data from Memory Cells
Micron Technology, Inc.
0 cites - US117625992023Self Adapting Iterative Read Calibration to Retrieve Data from Memory Cells
Micron Technology, Inc.
0 cites - US117502182023Iterative Error Correction with Adjustable Parameters After a Threshold Number of Iterations
Micron Technology, Inc.
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- US117409702023Dynamic Adjustment of Data Integrity Operations of a Memory System Based on Error Rate Classification
Micron Technology, Inc.
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Micron Technology, Inc.
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- US117105272023Mitigating a Voltage Condition of a Memory Cell in a Memory Sub-system
Micron Technology, Inc.
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- US117110952023Bit Flipping Low-density Parity-check Decoders with Low Error Floor
Micron Technology, Inc.
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- US116936572023Methods for Performing Fused-multiply-add Operations on Serially Allocated Data Within a Processing-in-memory Capable Memory Device, and Related Memory Devices and Systems
Micron Technology, Inc.
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- US116766642023Voltage Bin Selection for Blocks of a Memory Device After Power Up of the Memory Device
Micron Technology, Inc.
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Micron Technology, Inc.
0 cites - US116703962023Determine Bit Error Count Based on Signal and Noise Characteristics Centered at an Optimized Read Voltage
Micron Technology, Inc.
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- US116629052023Memory System Performance Enhancements Using Measured Signal and Noise Characteristics of Memory Cells
Micron Technology, Inc.
0 cites - US116578862023Intelligent Proactive Responses to Operations to Read Data from Memory Cells
Micron Technology, Inc.
0 cites - US116321322023Configuring Iterative Error Correction Parameters Using Criteria from Previous Iterations
Micron Technology, Inc.
0 cites - US116200742023Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
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- US115876242023Coarse Calibration Based on Signal and Noise Characteristics of Memory Cells Collected in Prior Calibration Operations
Micron Technology, Inc.
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- US115876382023Read Model of Memory Cells Using Information Generated During Read Operations
Micron Technology, Inc.
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- US115866792023Proactive Corrective Actions in Memory Based on a Probabilistic Data Structure
Micron Technology, Inc.
0 cites - US115810472023Iterative Read Calibration Enhanced According to Patterns of Shifts in Read Voltages
Micron Technology, Inc.
0 cites - US115627932023Read Soft Bits Through Boosted Modulation Following Reading Hard Bits
Micron Technology, Inc.
0 cites - US115628012023Determine Signal and Noise Characteristics Centered at an Optimized Read Voltage
Micron Technology, Inc.
0 cites - US115564172023Reduction of Errors in Data Retrieved from a Memory Device to Apply an Error Correction Code of a Predetermined Code Rate
Micron Technology, Inc.
0 cites - 0 cites