Siqing Nie

3 Patents

• US125782842026

  Detecting Defects in Array Regions on Specimens

  KLA Corporation

  0 cites
• US121905002025

  Detecting Defects on Specimens

  KLA Corp.

  0 cites
• US121653062024

  Segmentation of Design Care Areas with a Rendered Design Image

  0 cites