6 Patents
- US125661252026Sequencer Focus Quality Metrics and Focus Tracking for Periodically Patterned Surfaces
Illumina, Inc.
0 cites - US124228242025System and Method for Controlling an Operation of a Machine Including at Least One Actuator
Mitsubishi Electric Research Laboratories, Inc.
0 cites - US123649892025High Throughput Method and System for Analyzing the Effects of Agents on Planaria
INVERITEK, LLC
0 cites - 0 cites
- US119289572024Audiovisual Secondary Haptic Signal Reconstruction Method Based on Cloud-edge Collaboration
NANJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS
0 cites - 0 cites