Patents/Inventors

Simon Philip Spencer Hastings

San Jose, CAUS6 patents

7 Patents

US121693662024
Voltage Contrast Metrology Mark
ASML Netherlands B.V.
0 cites
US120559042024
Method to Predict Yield of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US120449802024
Method of Manufacturing Devices
ASML NETHERLANDS B.V.
0 cites
US119472662024
Method for Controlling a Manufacturing Process and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites
US118031272023
Method for Determining Root Cause Affecting Yield in a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US117549312023
Method for Determining Corrections for Lithographic Apparatus
ASML NETHERLANDS B.V.
0 cites
US117143572023
Method to Predict Yield of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites