Patents/Inventors

Simon Hendrik Celine Van Gorp

Oud-TurnhoutBE6 patents

6 Patents

US124168682025
Non-correctable Error in Metrology
ASML NETHERLANDS B.V.
0 cites
US122875822025
Method for Controlling a Lithographic Apparatus and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites
US121971362025
Method of Determining Control Parameters of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US121693662024
Voltage Contrast Metrology Mark
ASML Netherlands B.V.
0 cites
US117684422023
Method of Determining Control Parameters of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US117143572023
Method to Predict Yield of a Device Manufacturing Process
ASML NETHERLANDS B.V.
0 cites