3 Patents
- US122534992025Thin-layer Chromatography System and Method for Assessing Analyte Concentrations in Samples
UCL BUSINESS Ltd
0 cites - US120993042024Electron Beam Lithography with Dynamic Fin Overlay Correction
International Business Machines Corporation
0 cites - US118529752023Electron Beam Lithography with Dynamic Fin Overlay Correction
INTERNATIONAL BUSINESS MACHINES CORPORATION
0 cites