Sih-jie Liu

2 Patents

• US122835152025

  Method and Device to Reduce Epitaxial Defects Due to Contact Stress Upon a Semicondcutor Wafer

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US119786342024

  Reduce Well Dopant Loss in Finfets Through Co-implantation

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites