16 Patents
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- US124671362025Process Characterization and Correction Using Optical Wall Process Sensor (OWPS)
Applied Materials, Inc.
0 cites - US124696862025Process Characterization and Correction Using Optical Wall Process Sensor (OWPS)
Applied Materials, Inc.
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- US120805192024Smart Dynamic Load Simulator for RF Power Delivery Control System
Applied Materials, Inc.
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- US118298732023Predictive Modeling of a Manufacturing Process Using a Set of Trained Inverted Models
Applied Materials, Inc.
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- US115453762023Plasma Parameters and Skew Characterization by High Speed Imaging
Applied Materials, Inc.
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