Si Wen

2 Patents

• US122720592025

  System and Method Associated with Predicting Segmentation Quality of Objects in Analysis of Copious Image Data

  The Research Foundation For The State University Of New York

  0 cites
• US117488772023

  System and Method Associated with Predicting Segmentation Quality of Objects in Analysis of Copious Image Data

  The Research Foundation For The State University Of New York

  0 cites