Shunran Di

3 Patents

• US118369672023

  Method and Device for Small Sample Defect Classification and Computing Equipment

  GOERTEK, Inc.

  0 cites
• US117489752023

  Method and Device for Optimizing Object-class Model Based on Neural Network

  GOERTEK Inc.

  0 cites
• US117415932023

  Product Defect Detection Method, Device and System

  GOERTEK Inc.

  0 cites