Patents/Inventors

Shunichi Matsumoto

TokyoJP10 patents

11 Patents

US124008892025
Defect Inspection Device
HITACHI HIGH-TECH CORPORATION
0 cites
US123665382025
Defect Inspection Apparatus and Defect Inspection Method
HITACHI HIGH-TECH CORPORATION
0 cites
US123456612025
Defect Inspection Apparatus and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US123135662025
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US121468402024
Defect Inspection Device
HITACHI HIGH-TECH CORPORATION
0 cites
US120855172024
Lighting Optical System and Substrate Inspecting Device
Hitachi High-tech Corporation
0 cites
US120446272024
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US120255692024
Defect Inspection Device and Inspection Method, and Optical Module
HITACHI HIGH-TECH CORPORATION
0 cites
US119826312024
Defect Detection Device, Defect Detection Method, and Defect Observation Apparatus Including Defect Detection Device
HITACHI HIGH-TECH CORPORATION
0 cites
US118285222023
Cryogenic Refrigerator and Biomagnetic Measurement Apparatus
RICOH COMPANY, Ltd.
0 cites
US115800112023
Operation Verifying Apparatus, Operation Verifying Method and Operation Verifying System
NOMURA RESEARCH INSTITUTE, Ltd.
0 cites