6 Patents
- US124113282025Method for Ptychography Position Correction Based on Probe Weighting
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US118189552023Method for Forming Piezoelectric Films on Surfaces of Arbitrary Morphologies
City University Of Hong Kong
0 cites - US116876972023Method and System for Correcting Lithography Process Hotspots Based on Stress Damping Adjustment
Wuhan Yuwei Optical Software Co., Ltd.
0 cites - US116621972023Rapid Measurement Method for Ultra-thin Film Optical Constant
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US116444132023Method for Measuring Dielectric Tensor of Material
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US116198832023Snapshot Type Overlay Error Measuring Device and Measuring Method
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites