Patents/Inventors

Shinya Kikuta

TakatsukiJP1 patent

2 Patents

US117964952023
Total Reflection X-ray Fluorescence Spectrometer and Estimation Method
RIGAKU CORPORATION
0 cites
US116091922023
Energy Dispersive X-ray Fluorescent Spectrometer, Evaluation Method, and Evaluation Program
Rigaku Corporation
0 cites