Shino Ohira

3 Patents

• US125421972026

  Feature Quantity Calculating Method, Feature Quantity Calculating Program, Feature Quantity Calculating Device, Screening Method, Screening Program, and Compound Creating Method

  FUJIFILM Corporation

  0 cites
• US122494062025

  Feature Quantity Calculating Method, Feature Quantity Calculating Program, and Feature Quantity Calculating Device, Screening Method, Screening Program, and Screening Device, Compound Creating Method, Compound Creating Program, and Compound Creating Device

  FUJIFILM Corporation

  0 cites
• US116947672023

  Method for Searching for Molecular Stable Structure, Program for Searching for Molecular Stable Structure, and Device for Searching for Molecular Stable Structure

  FUJIFILM Corporation

  0 cites