Patents/Inventors

Shinji Ueyama

YokohamaJP8 patents

7 Patents

US125607922026
Polarized Microscope and Intra Image Field Correction Analysis Method
Samsung Electronics Co., Ltd.
0 cites
US125353152026
Optical Device and Optical Measurement Method
Samsung Electronics Co., Ltd.
0 cites
US125001072025
Mounting Device and Mounting Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124396072025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US123275792025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US120516042024
Apparatus for Manufacturing Semiconductor Device and Method of Manufacturing Semiconductor Device
Samsung Electronics Co., Ltd.
0 cites
US117966082023
Magnetic Property Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites