Patents/Inventors

Shingo Hayashi

TokyoJP16 patents

14 Patents

US125309142026
Work Record Extraction Device and Work Record Extraction System
Hitachi, Ltd.
0 cites
US125074522025
Silicon Carbide Semiconductor Device and Method of Manufacturing Silicon Carbide Semiconductor Device
FUJI ELECTRIC CO., Ltd.
0 cites
US123793252025
External Appearance Inspection Apparatus and External Appearance Inspection Method
OMRON CORPORATION
0 cites
US123728972025
Image Forming Apparatus, Image Forming Method, and Printed Material
RICOH COMPANY, Ltd.
0 cites
US123494512025
Silicon Carbide Semiconductor Device and Method of Manufacturing Silicon Carbide Semiconductor Device
FUJI ELECTRIC CO., Ltd.
0 cites
US123409702025
Charged Particle Beam Device, and Method for Controlling Charged Particle Beam Device
HITACHI HIGH-TECH CORPORATION
0 cites
US123268352025
File Management System and Work Support System
HITACHI, Ltd.
0 cites
US123277082025
Charged Particle Beam Device and Aberration Correction Method
Hitachi High-tech Corporation
0 cites
US121320832024
Silicon Carbide Semiconductor Device
FUJI ELECTRIC CO., Ltd.
0 cites
US120721802024
Measurement Method for Amount of Deviation, and Measurement Apparatus
OMRON CORPORATION
0 cites
US119369852024
Appearance Inspection Device and Defect Inspection Method
OMRON CORPORATION
0 cites
US117423922023
Silicon Carbide Semiconductor Device and Method of Manufacturing Silicon Carbide Semiconductor Device
FUJI ELECTRIC CO., Ltd.
0 cites
US117217562023
Semiconductor Device
FUJI ELECTRIC CO., Ltd.
0 cites
US117090502023
Position Measurement Method Using a Calibration Plate to Correct a Detection Value from the Position Detector
OMRON CORPORATION
0 cites