Patents/Inventors

Shih-yuan Ma

New TaipeiTW3 patents

4 Patents

US124168562025
Method of Manufacturing Semiconductor Device Structure
NANYA TECHNOLOGY CORPORATION
0 cites
US122422022025
Method for Overlay Error Correction
NANYA TECHNOLOGY CORPORATION
0 cites
US120027652024
Marks for Overlay Measurement and Overlay Error Correction
NANYA TECHNOLOGY CORPORATION
0 cites
US117969242023
Method for Overlay Error Correction and Method for Manufacturing a Semiconductor Device Structure with Overlay Marks
NANYA TECHNOLOGY CORPORATION
0 cites