Shih-shin Wang

3 Patents

• US121311112024

  Method, Apparatus and Device for Measuring Semiconductor Structure

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US119276202024

  Method for Simulating Electricity of Wafer Chip

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US119306302024

  Dynamic Random Access Memory Capacitor and Preparation Method Therefor

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites