Shih-chieh Lin

9 Patents

• US124242962025

  Circuit for Testing Memories

  REALTEK SEMICONDUCTOR CORPORATION

  0 cites
• US122494952025

  Etching Method of Etching Apparatus

  Winbond Electronics Corp.

  0 cites
• US121710952024

  Memory Structure

  Winbond Electronics Corp.

  0 cites
• US121423402024

  Testing System and Testing Method

  Realtek Semiconductor Corporation

  0 cites
• US119356112024

  Memory Device, Memory Test Circuit and Memory Test Method Thereof Having Repair Information Maintaining Mechanism

  REALTEK SEMICONDUCTOR CORPORATION

  0 cites
• US118320292023

  Projection System and Projection Image Adjustment Method Thereof

  Coretronic Corporation

  0 cites
• US117766482023

  Circuit for Testing Memory

  REALTEK SEMICONDUCTOR CORPORATION

  0 cites
• US117035312023

  Contact Resistor Test Method and Device

  Changxin Memory Technologies, Inc.

  0 cites
• US116658892023

  Semiconductor Memory Structure

  WINBOND ELECTRONICS Corp.

  0 cites