Patents/Inventors

Shigeru Kasai

YamanashiJP22 patents

19 Patents

US125571822026
Heating Device and Control Method of Led
Tokyo Electron Limited
0 cites
US125123452025
Temperature Control Device, Temperature Control Method, and Inspection Apparatus
Tokyo Electron Limited
0 cites
US124361882025
LED Chuck
Tokyo Electron Limited
0 cites
US123526532025
Bearing Diagnosis Apparatus, Bearing Diagnosis Method, and Computer Readable Recording Medium
NEC CORPORATION
0 cites
US123565082025
Heater Temperature Control Method, Heater, and Placement Stand
Tokyo Electron Limited
0 cites
US123263562025
Vehicle Weight Estimation Apparatus, Vehicle Weight Estimation Method, and Computer Readable Recording Medium
NEC CORPORATION
0 cites
US122367772025
Vehicle Detection Apparatus, Method and Program
NEC CORPORATION
0 cites
US121638232024
Weight Estimation Apparatus, Weight Estimation Method, and Computer-readable Recording Medium
NEC CORPORATION
0 cites
US121112912024
Structure Diagnosis Apparatus, Structure Diagnosis Method, and Computer-readable Recording Medium
NEC CORPORATION
0 cites
US119404852024
Inspection Apparatus and Inspection Method
TOKYO ELECTRON LIMITED
0 cites
US118287942023
Placement Table, Testing Device, and Testing Method
Tokyo Electron Limited
0 cites
US117744882023
Inspection Apparatus Including Power Supply for Supplying Power to Heating Mechanism Used for Heating Device
Tokyo Electron Limited
0 cites
US117768292023
Dummy Wafer
TOKYO ELECTRON LIMITED
0 cites
US117682362023
Test Device Control Method and Test Device
Tokyo Electron Limited
0 cites
US117620112023
Temperature Adjustment Method for Mounting Base, Inspection Device, and Mounting Base
Tokyo Electron Limited
0 cites
US116686652023
Silicon Heater Bonded to a Test Wafer
TOKYO ELECTRON LIMITED
0 cites
US116091492023
State Estimation Apparatus, State Estimation Method, and Computer-readable Recording Medium
NEC CORPORATION
0 cites
US115790402023
Damage Diagnosis Device, Damage Diagnosis Method, and Recording Medium in Which Damage Diagnosis Program Is Stored
NEC CORPORATION
0 cites
US115434452023
Inspection Apparatus
TOKYO ELECTRON LIMITED
0 cites