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Inventors
Sheng-lin Lin
Hsinchu
TW
3 patents
4 Patents
US12424296
2025
Circuit for Testing Memories
REALTEK SEMICONDUCTOR CORPORATION
0 cites
US12142340
2024
Testing System and Testing Method
Realtek Semiconductor Corporation
0 cites
US11935611
2024
Memory Device, Memory Test Circuit and Memory Test Method Thereof Having Repair Information Maintaining Mechanism
REALTEK SEMICONDUCTOR CORPORATION
0 cites
US11776648
2023
Circuit for Testing Memory
REALTEK SEMICONDUCTOR CORPORATION
0 cites