Patents/Inventors

Sheng-hsun Wu

ZhubeiTW1 patent

2 Patents

US118675952024
X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites
US115790992023
X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites