12 Patents
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- US124380492025Methods for Reducing Contact Depth Variation in Semiconductor Fabrication
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd
0 cites - US124263802025Integrated Circuit Having Angled Conductive Feature
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US124023842025Standard Cell Design with Dummy Padding
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US123763382025Semiconductor Device Structure with Dielectric Dummy Gate and Method for Forming the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122117872025Interconnect Structures and Methods of Fabrication Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US119963292024Method and IC Design with Non-linear Power Rails
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US116759492023Space Optimization Between SRAM Cells and Standard Cells
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US116409362023Interconnect Structures and Methods of Fabrication Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US116316612023Integrated Circuit Having Angled Conductive Feature
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US115812212023Method and IC Design with Non-linear Power Rails
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd
0 cites