Patents/Inventors

Shay Yogev

Kibbutz Kfar MenachemIL7 patents

7 Patents

US125617932026
Machine Learning Based Examination for Process Monitoring
Applied Materials Israel Ltd.
0 cites
US124691242025
Machine Learning Based Yield Prediction
Applied Materials Israel Ltd.
0 cites
US123211022025
Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
0 cites
US122363642025
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US119292912024
Layer Detection for High Aspect Ratio Etch Control
NOVA Ltd.
0 cites
US118158192023
Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
0 cites
US117631812023
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites