Shashank Shrikant Agashe

4 Patents

• US124122922025

  System and Method for Brightfield Inspection of Circular Rotating Wafers

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US122551102025

  Methods and Systems for Real-time Quality Control of a Film in a Spin Coating Process

  Samsung Electronics Co., Ltd.

  0 cites
• US120573362024

  Estimating Heights of Defects in a Wafer by Scaling a 3D Model Using an Artificial Neural Network

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US116399062023

  Method and System for Virtually Executing an Operation of an Energy Dispersive X-ray Spectrometry (EDS) System in Real-time Production Line

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites