11 Patents
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- US124809902025Technique for Enabling On-die Noise Measurement During Ate Testing and IST
NVIDIA Corporation
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- US122912192025Asynchronous In-system Testing for Autonomous Systems and Applications
NVIDIA CORPORATION
0 cites - US121243462024Leveraging Low Power States for Fault Testing of Processing Cores at Runtime
NVIDIA Corporation
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- US118677442024Techniques for Isolating Interfaces While Testing Semiconductor Devices
NVIDIA Corporation
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- US115738722023Leveraging Low Power States for Fault Testing of Processing Cores at Runtime
NVIDIA Corporation
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