Shannon Wang

3 Patents

• US124305262025

  Method and System for Scanning a Code on a Transparent Part

  Applied Materials Inc.

  0 cites
• US123622112025

  Detecting Defects of Semiconductor Manufacturing Assemblies

  APPLIED MATERIALS, Inc.

  0 cites
• US123374152025

  Method and Apparatus for Laser Texturing a Component

  APPLIED MATERIALS, Inc.

  0 cites