Shang-chi Wang

8 Patents

• US125946302026

  Amorphous Phase Modification Apparatus and Processing Method of Single Crystal Material

  Mradian Femto Sources Co., Ltd.

  0 cites
• US123076462025

  Method for Identifying Wafer

  Globalwafers Co., Ltd.

  0 cites
• US121875382025

  Method for Calculating Object Pick-and-place Sequence and Electronic Apparatus for Automatic Storage Pick-and-place

  Globalwafers Co., Ltd.

  0 cites
• US121187052024

  Automated Optical Inspection Method, Automated Optical Inspection System and Storage Medium

  Globalwafers Co., Ltd.

  0 cites
• US120446312024

  Wafer Surface Defect Inspection Method and Apparatus Thereof

  Globalwafers Co., Ltd.

  0 cites
• US119713652024

  Wafer Processing System and Rework Method Thereof

  Globalwafers Co., Ltd.

  0 cites
• US118599652024

  Material Analysis Method

  Globalwafers Co., Ltd.

  0 cites
• US118524652023

  Wafer Inspection Method and Apparatus Thereof

  Globalwafers Co., Ltd.

  0 cites