Patents/Inventors

Shane Nowell

Boise, IDUS39 patents

41 Patents

US123933632025
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US122290002025
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US120571852024
Voltage Calibration Scans to Reduce Memory Device Overhead
Micron Technology, Inc.
0 cites
US119666162024
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US119412772024
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US119283472024
Managing Voltage Bin Selection for Blocks of a Memory Device
Micron Technology, Inc.
0 cites
US119157762024
Error Avoidance Based on Voltage Distribution Parameters of Block Families
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118686392024
Providing Recovered Data to a New Memory Cell at a Memory Sub-system Based on an Unsuccessful Error Correction Operation
MICRON TECHNOLOGY, Inc.
0 cites
US118535562023
Combining Sets of Memory Blocks in a Memory Device
Micron Technology, Inc.
0 cites
US118473172023
Managing Bin Placement for Block Families of a Memory Device Based on Trigger Metric Valves
Micron Technology, Inc.
0 cites
US118417532023
Operating Temperature Management of a Memory Sub-system
0 cites
US118372912023
Voltage Offset Bin Selection by Die Group for Memory Devices
Micron Technology, Inc.
0 cites
US118373072023
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US118237222023
Determining Voltage Offsets for Memory Read Operations
MICRON TECHNOLOGY, Inc.
0 cites
US118237482023
Voltage Bin Calibration Based on a Temporary Voltage Shift Offset
Micron Technology, Inc.
0 cites
US117839012023
Multi-tier Threshold Voltage Offset Bin Calibration
Micron Technology, Inc.
0 cites
US117686192023
Voltage Based Combining of Block Families for Memory Devices
Micron Technology, Inc.
0 cites
US117554782023
Block Family Combination and Voltage Bin Selection
Micron Technology, Inc.
0 cites
US117338962023
Reliability Scan Assisted Voltage Bin Selection
Micron Technology, Inc.
0 cites
US117352542023
Error Avoidance Based on Voltage Distribution Parameters of Blocks
Micron Technology, Inc.
0 cites
US117266892023
Time-based Combining for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US117202862023
Extended Cross-temperature Handling in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117214092023
Smart Sampling for Block Family Scan
Micron Technology, Inc.
0 cites
US117097272023
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US117105272023
Mitigating a Voltage Condition of a Memory Cell in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117042172023
Charge Loss Scan Operation Management in Memory Devices
Micron Technology, Inc.
0 cites
US117051922023
Managing Read Level Voltage Offsets for Low Threshold Voltage Offset Bin Placements
Micron Technology, Inc.
0 cites
US117051932023
Error Avoidance Based on Voltage Distribution Parameters
Micron Technology, Inc.
0 cites
US116937452023
Error-handling Flows in Memory Devices Based on Bins
Micron Technology, Inc.
0 cites
US116755092023
Multiple Open Block Families Supporting Multiple Cursors of a Memory Device
Micron Technology, Inc.
0 cites
US116755112023
Associating Multiple Cursors with Block Family of Memory Device
Micron Technology, Inc.
0 cites
US116755292023
Threshold Voltage Determination for Calibrating Voltage Bins of a Memory Device
Micron Technology, Inc.
0 cites
US116766642023
Voltage Bin Selection for Blocks of a Memory Device After Power Up of the Memory Device
Micron Technology, Inc.
0 cites
US116627862023
Temperature Compensation in a Memory System
Micron Technology, Inc.
0 cites
US116251772023
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US116200742023
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US115930052023
Managing Voltage Bin Selection for Blocks of a Memory Device
Micron Technology, Inc.
0 cites
US115876272023
Determining Voltage Offsets for Memory Read Operations
Micron Technology, Inc.
0 cites
US115876392023
Voltage Calibration Scans to Reduce Memory Device Overhead
Micron Technology, Inc.
0 cites