4 Patents
- US122605432025Machine Learning Based Examination of a Semiconductor Specimen and Training Thereof
Applied Materials Israel Ltd.
0 cites - US119154062024Generating Training Data Usable for Examination of a Semiconductor Specimen
APPLIED MATERIALS ISRAEL Ltd.
0 cites - US118541842023Determination of Defects And/or Edge Roughness in a Specimen Based on a Reference Image
Applied Materials Israel Ltd.
0 cites - 0 cites